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MAX3232CSE 开发手册 - Maxim Integrated(美信)
制造商:
Maxim Integrated(美信)
分类:
接口芯片
封装:
SOIC-16
描述:
3.0V至5.5V ,低功耗,高达1Mbps ,真RS - 232收发器,使用四只0.1μF外部电容 3.0V to 5.5V, Low-Power, up to 1Mbps, True RS-232 Transceivers Using Four 0.1レF External Capacitors
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3D模型
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引脚图
产品图
MAX3232CSE数据手册
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touches an I/O port. The discharges accompanying these routine events can render an I/O port useless by
destroying one or more interface ICs connected to the port. These failures can be expensive in terms of
both warranty repairs and perceived quality.
ESD can cause further damage to manufacturers, since equipment manufacturers may soon be barred
from selling to the European Community if their equipment fails to meet minimum levels of ESD
performance, as spelled out by IEC 801-2.
These two factors have led Maxim to develop a family of RS-232 products with ±15kV of ESD protection
(Table A). These interface ICs are the only ones to specify and achieve ±15kV ESD protection using both
the human body model and the IEC 801-2 air-gap discharge method. Maxim's high-ESD protection
eliminates the need for costly external protection devices such as TransZorb, while preventing expensive
field failures.
Table A. RS-232-interface ICs with ±15kV ESD Protection
Device
No. of
Drivers/
Receivers
ESD Level (kV)
Capacitor
Value
(mF)
Latchup
Free
Data
Rate
(kbps)
No. of
Active
Receivers
in SHDN
SHDN
I
CC
(mA)
Price
1000
pc.
(S)
Human
Body
Model
IEC 801-2
Contact
Discharge
Air-Gap
Discharge
MAX202E 2/2 ±15 ±8 ±15 0.1 Yes 120 0 N/A 1.85
MAX211E 4/5 ±15 ±8 ±15 0.1 Yes 120 0 1 3.62
MAX213E 4/5 ±15 ±8 ±15 0.1 Yes 120 2 15 3.62
MAX232E 2/2 ±15 ±8 ±15 1.0 Yes 120 0 N/A 1.85
MAX241E 4/5 ±15 ±8 ±15 1.0 Yes 120 0 1 3.62
Older ESD Test Methods
Two methods have been commonly used for testing the ESD susceptibility of integrated circuits. The
oldest, method 3015.7 of MIL-standard 883 (also known as the human body model), was developed to aid
manufacturers in understanding the precautions necessary for packaging and handling ICs. This method
tests each package pin against all other pins, and classifies a device according to the voltage at which the
first failure occurs (which is usually on the pin most susceptible to ESD). The applied ESD waveform is
derived from a circuit called the human body model (Figure A). The capacitance (100pF) models that of the
human body, and the resistance (1500Ω) models the typical series resistance in the discharge path that
includes the body, the IC, and ground.
Figure A. Most ESD standards specify the same test circuit, but with different component values.
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