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PC28F256P33TFE
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PC28F256P33TFE数据手册
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Datasheet Jul 2011
1 Order Number: 320003-10
Numonyx
®
Flash Memory (P33-65nm)
256-Mbit, 512-Mbit (256M/256M)
Datasheet
Product Features
High performance:
95ns initial access time for Easy BGA
105ns initial access time for TSOP
25ns 16-word asynchronous-page read
mode
52MHz (Easy BGA) with zero wait states,
17ns clock-to-data output synchronous-
burst read mode
4-, 8-, 16-, and continuous-word options
for burst mode
Buffered Enhanced Factory Programming at
2.0MByte/s (typ) using 512-word buffer
3.0V buffered programming at 1.14 MByte/
s (Typ) using 512-word buffer
Architecture:
Multi-Level Cell Technology: Highest
Density at Lowest Cost
Asymmetrically-blocked architecture
Four 32-KByte parameter blocks: top or
bottom configuration
128-KByte main blocks
Blank Check to verify an erase block
Voltage and Power:
—V
CC
(core) voltage: 2.3 V – 3.6 V
—V
CCQ
(I/O) voltage: 2.3 V – 3.6 V
Standby current: 65uA (Typ) for 256-Mbit
Continuous synchronous read current: 21
mA (Typ)/24 mA (Max) at 52 MHz
Security:
One-Time Programmable Registers:
64 unique factory device identifier bits
2112 user-programmable OTP bits
Absolute write protection: V
PP
= V
SS
Power-transition erase/program lockout
Individual zero-latency block locking
Individual block lock-down capability
Password Access feature
Software:
25µs (Typ) program suspend
25µs (Typ) erase suspend
Numonyx™ Flash Data Integrator optimized
Basic Command Set and Extended Function
Interface Command Set compatible
Common Flash Interface capable
Density and Packaging
56-Lead TSOP package (256-Mbit only)
64-Ball Easy BGA package (256, 512-Mbit)
16-bit wide data bus
Quality and Reliability
—JESD47E Compliant
Operating temperature: –40 °C to +85 °C
Minimum 100,000 erase cycles per block
65nm ETOX™ X process technology

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