Datasheet 搜索 > 双极性晶体管 > Fairchild(飞兆/仙童) > 2SC5200RTU 数据手册 > 2SC5200RTU 其他数据使用手册 5/13 页

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2SC5200RTU 其他数据使用手册 - Fairchild(飞兆/仙童)
制造商:
Fairchild(飞兆/仙童)
分类:
双极性晶体管
封装:
TO-264-3
描述:
NPN外延硅晶体管 NPN Epitaxial Silicon Transistor
Pictures:
3D模型
符号图
焊盘图
引脚图
产品图
页面导航:
封装尺寸在P2
导航目录
2SC5200RTU数据手册
Page:
of 13 Go
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Qualification Plan
Device
Package
Process
No. of Lots
Q20150030
FGA20S140P
TO3P
Assembly+Test
1
Test Description:
Condition:
Standard:
Duration:
Results:
High Temperature Reverse
Bias Test
Ta=175°C,80% BV rating
JESD22-A108
1000 hrs
0/77
High Temperature Gate Bias
Ta=175°C,100% VGS rating
JESD22-A108-B
1000 hrs
0/77
Power Cycle
Delta Tj = 100C, 5 min on, 5
min off
Mil Std 750
Method 1037
JESD22-A105
6000 cycles
0/77
High Temperature Storage Life
150°C
JESD22-A103
1000 hrs
0/77
Temperature Cycle
-65C to 150 C, 30 min/cycle
JESD22-A104
500 cycles
0/77
Highly Accelerated Stress Test
130°C 85%, 80% rated
BV,MAX=42V
JESD22-A110-B
96 hrs
0/77
Resistance to solder heat
270°C
JESD22-B106
15sec
0/30
Qualification Plan
Device
Package
Process
No. of Lots
Q20150030
FGA25N120ANTDTU_F109
TO3P
Assembly+Test
1
Test Description:
Condition:
Standard:
Duration:
Results:
High Temperature Gate Bias
Ta=175°C,100% VGS rating
JESD22-A108-B
1000 hrs
0/77
Power Cycle
Delta Tj = 100C, 5 min on, 5 min
off
Mil Std 750
Method 1037
JESD22-A105
6000 cycles
0/77
High Temperature Storage
Life
150°C
JESD22-A103
1000 hrs
0/77
Temperature Cycle
-65C to 150 C, 30 min/cycle
JESD22-A104
500 cycles
0/77
Highly Accelerated Stress
Test
130°C 85%, 80% rated
BV,MAX=42V
JESD22-A110-B
96 hrs
0/77
Resistance to solder heat
270°C
JESD22-B106
15sec
0/30
Qualification Plan
Device
Package
Process
No. of Lots
Q20150030
FCA76N60N
TO3P
Assembly+Test
1
Test Description:
Condition:
Standard:
Duration:
Results:
High Temperature Reverse
Bias Test
Ta=175°C,80% BV rating
JESD22-A108
1000 hrs
0/77
High Temperature Gate Bias
Ta=175°C,100% VGS rating
JESD22-A108-B
1000 hrs
0/77
Power Cycle
Delta Tj = 100C, 5 min on, 5
min off
Mil Std 750
Method 1037
JESD22-A105
6000 cycles
0/77
High Temperature Storage Life
150°C
JESD22-A103
1000 hrs
0/77
Temperature Cycle
-65C to 150 C, 30 min/cycle
JESD22-A104
500 cycles
0/77
Highly Accelerated Stress Test
130°C 85%, 80% rated
BV,MAX=42V
JESD22-A110-B
96 hrs
0/77
Resistance to solder heat
270°C
JESD22-B106
15sec
0/30
5 of 6
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