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CSD16325Q5C
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CSD16325Q5C数据手册
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Texas Instruments, Inc. PCN#20140523000A
CSD16401Q5
CSD17309Q3
CSD18540Q5B
CSD87351ZQ5D
CSD16406Q3
CSD17311Q5
CSD19502Q5B
CSD87352Q5D
CSD16407Q5
CSD17312Q5
CSD19532Q5B
CSD87353Q5D
CSD16407Q5C
Qualification Data Approved May, 2014
This qualification has been specifically developed for the validation of this change. The qualification data
validates that the proposed change meets the applicable released technical specifications.
Reference Qualification# 1 : CSD87331Q3D (MSL 1-260C)
Package Construction Details
Assembly Site:
PAC
Mold Compound:
SID#200805
# Pins-Designator, Family:
8-DQZ, LSON-CLIP
Mount Solder:
SID#200757
Lead frame (Finish, Base):
Matte Sn, Cu
Bond Wire:
1.0 Mil Dia., Au
Qualification: Plan Test Results
Reliability Test
Conditions
Sample Size/Fail
**T/C -40C/125C
-40C/+125C (500 Cyc)
77/0
Notes **- Preconditioning sequence: Level 1-260C.
Qualification Data Approved May, 2014
This qualification has been specifically developed for the validation of this change. The qualification data
validates that the proposed change meets the applicable released technical specifications.
Reference Qualification# 2 : CSD58869Q5D (MSL 1-260C)
Package Construction Details
Assembly Site:
PAC
Mold Compound:
SID#202828
# Pins-Designator, Family:
8-DQY, LSON-CLIP
Mount Solder:
SID#200757
Lead frame (Finish, Base):
Matte Sn, Cu
Bond Wire:
1.0 Mil Dia., Au
Qualification: Plan Test Results
Reliability Test
Conditions
Sample Size/Fail
**T/C -40C/125C
-40C/+125C (500 Cyc)
77/0
Notes **- Preconditioning sequence: Level 1-260C.
Qualification Data Approved May, 2014
This qualification has been specifically developed for the validation of this change. The qualification data
validates that the proposed change meets the applicable released technical specifications.
Reference Qualification# 3 : CSD16407Q5 (MSL 1-260C)
Package Construction Details
Assembly Site:
PAC
Mold Compound:
SID#202828
# Pins-Designator, Family:
8-DQH, LSON-CLIP
Mount Solder:
SID#200757
Lead frame (Finish, Base):
Matte Sn, Cu
Bond Wire:
1.0 Mil Dia., Au
Qualification: Plan Test Results
Reliability Test
Conditions
Sample Size/Fail
**T/C -40C/125C
-40C/+125C (500 Cyc)
77/0
Notes **- Preconditioning sequence: Level 1-260C.

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