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CSD87312Q3E 其他数据使用手册 - TI（德州仪器）
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PowerTDFN-8
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双30 -V N通道NexFET功率MOSFET Dual 30-V N-Channel NexFET Power MOSFETs
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CSD87312Q3E数据手册
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Texas Instruments, Inc. PCN# 20131015000
PCN Number:
20131015000
PCN Date:
10/18/2013
Title:
Qualification of 12mm Tape width for Select Devices on QFN Package
Customer Contact:
PCN Manager
Phone:
+1(214)480-6037
Dept:
Quality Services
Proposed 1
st
Ship Date:
01/18/2014
Estimated Sample
Availability:
Date provided upon
sample request
Change Type:
Packing/Shipping/Labeling
PCN Details
Description of Change:
Final Notification to announce the qualification from 16mm tape width to 12mm tape width for
QFN devices (See Appendix A for the Carrier Tape “From/To” Detail).
Pack BOM
Package
Size
Current
Proposed
TI P/N
Details
TI P/N
Details
Tape
3.3x3.3mm
4212589-0004
16mm width
4212589-0018
12mm width
Reason for Change:
Standardization of tape width size for 3.3x3.3mm QFN packages.
Anticipated impact on Form, Fit, Function, Quality or Reliability (positive / negative):
None
Changes to product identification resulting from this PCN:
None
Product Affected:
CSD87312Q3E
CSD95379Q3M
Qualification Data:
This qualification has been specifically developed for the validation of this change. The
qualification data validates that the proposed change meets the applicable released technical
specifications.
Qualification: Plan Test Results
Qualification Device Construction Details:
12mm tape Width
Pass/Fail
First Article Inspection Test:
PASS
Manufacturability Test:
PASS
Dimensional Test:
PASS
Camber Test:
PASS
Surface Resistivity Test:
PASS
Fit Analysis:
PASS
Drop Test:
PASS
For questions regarding this notice, e-mails can be sent to the regional contacts shown below
or your local Field Sales Representative.
Location
E-Mail
USA
PCNAmericasContact@list.ti.com
Europe
PCNEuropeContact@list.ti.com
Asia Pacific
PCNAsiaContact@list.ti.com
Japan
PCNJapanContact@list.ti.com
See Appendix A on the following two pages
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