Datasheet 搜索 > 地磁传感器 > TI（德州仪器） > DRV5023FAQDBZR 数据手册 > DRV5023FAQDBZR 其他数据使用手册 3/4 页
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DRV5023FAQDBZR 其他数据使用手册 - TI（德州仪器）
制造商:
TI（德州仪器）
分类:
地磁传感器
封装:
SOT-23-3
描述:
TEXAS INSTRUMENTS DRV5023FAQDBZR 霍尔效应开关, 单极性, 0.0035 T, 0.002 T, 2.5 V, 38 V, SOT-23 新
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DRV5023FAQDBZR数据手册
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若手册格式错乱，请下载阅览PDF原文件
Texas Instruments, Inc. PCN#20170627002
Qualification Results
Data Displayed as: Number of lots / Total sample size / Total failed
Type
Test Name / Condition
Duration
Qual Device:
DRV5013ADQDBZR
QBS Product
Reference:
DRV5013ADQDBZ
QBS Process
Reference:
SN84002PAP
AC
Autoclave 121C
96 Hours
3/231/0
-
3/231/0
ED
Electrical Characterization
Per
Datasheet
Parameters
-
1/30/0
1/30/0
ELFR
Early Life Failure Rate, 125C
48 Hours
-
-
3/2400/0
FLAM
Flammability (IEC 695-2-2)
--
-
-
-
FLAM
Flammability (UL 94V-0)
--
-
-
-
FLAM
Flammability (UL-1694)
--
-
-
-
HAST
Biased HAST, 130C/85%RH
96 Hours
3/231/0
-
3/231/0
HBM
ESD - HBM
1500 V
-
1/3/0
-
CDM
ESD - CDM
1500 V
-
1/3/0
-
HTOL
Life Test, 125C
1000 Hours
-
-
3/231/0
HTOL
Life Test, 150C
300 Hours
-
-
-
HTSL
High Temp. Storage Bake,
150C
1000 Hours
-
-
3/231/0
HTSL
High Temp. Storage Bake,
170C
420 Hours
3/231/0
-
-
LI
Lead Fatigue
Leads
-
-
-
LI
Lead Pull to Destruction
Leads
-
-
-
LU
Latch-up
(per
JESD78)
-
1/18/0
1/6/0
PD
Physical Dimensions
--
3/30/0
-
-
SD
Solderability
Pb-Free
3/66/0
-
-
TC
Temperature Cycle, -
65/150C
500 Cycles
3/231/0
1/77/0
3/231/0
WBP
Bond Strength
Wires
-
-
-
WBS
Ball Bond Shear
Wires
-
-
-
Type
Test Name / Condition
Duration
QBS Package
Reference:
LM4040C50IDBZR
QBS Package
Reference:
LM4040D30IDBZR
QBS Package
Reference:
TLV431AIDBZR
AC
Autoclave 121C
96 Hours
1/77/0
1/77/0
1/77/0
ED
Electrical Characterization
Per
Datasheet
Parameters
1/30/0
1/30/0
1/30/0
ELFR
Early Life Failure Rate,
125C
48 Hours
-
-
-
FLAM
Flammability (IEC 695-2-2)
--
1/5/0
1/5/0
1/5/0
FLAM
Flammability (UL 94V-0)
--
1/5/0
1/5/0
1/5/0
FLAM
Flammability (UL-1694)
--
1/5/0
1/5/0
1/5/0
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