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DTA144EET1G 产品修订记录 - ON Semiconductor(安森美)
制造商:
ON Semiconductor(安森美)
分类:
双极性晶体管
封装:
SC-75-3
描述:
PNP 晶体管,ON Semiconductor### 标准Manufacturer Part Nos with S or NSV prefix are automotive qualified to AEC-Q101 standard.### 数字晶体管,On Semiconductor配备电阻器的双极性晶体管也称为数字晶体管或偏流电阻器的晶体管,包含一个或两个集成电阻器。 单一系列输入电阻器,或两个电阻器的分压器能直接从数字源驱动这些设备。 提供单和双晶体管型号。
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DTA144EET1G数据手册
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若手册格式错乱,请下载阅览PDF原文件

FINAL PRODUCT/PROCESS CHANGE NOTIFICATION #20349A
Generic Copy
Issue Date: 26-Nov-2014 Rev. 06-Jan-2010 Page 1 of 6
Issue Date: 26-Nov-2014
TITLE: Qualification of Niigata Fab (Japan) as the additional wafer source for Small Signal General
Purpose Transistors and Bias Resistor Transistors.
PROPOSED FIRST SHIP DATE: 03-Mar-2015
AFFECTED CHANGE CATEGORY(S):
ON Semiconductor Fab Site
FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION
:
Contact your local ON Semiconductor Sales Office or Farrah Omar <
farrah.omar@onsemi.com>
SAMPLES: Contact your local ON Semiconductor Sales Office
ADDITIONAL RELIABILITY DATA
: Available
Contact your local ON Semiconductor Sales Office or Laura Rivers <
laura.rivers@onsemi.com>
NOTIFICATION TYPE:
Final Product/Process Change Notification (FPCN)
Final change notification sent to customers. FPCNs are issued at least 90 days prior to
implementation of the change.
ON Semiconductor will consider this change approved unless specific conditions of acceptance are
provided in writing within 30 days of receipt of this notice. To do so, contact <quality@onsemi.com>
.
DESCRIPTION AND PURPOSE:
This is the Final Notification by ON Semiconductor notifying customers of its plan to add Niigata Fab
(Japan) as the qualified wafer source for Small Signal General Purpose Transistors and Bias
Resistor Transistors.
The Niigata Fab facility is an ON Semiconductor owned wafer fab that has been producing products
for ON Semiconductor. Several existing technologies within ON Semiconductor’s product families
are currently sourced from Niigata Fab. ON Semiconductor Niigata Wafer Fab is an internal factory
that is TS16949, ISO-9001 and ISO-14000 certified.
Qualification tests are designed to show that the reliability of the transferred devices will continue to
meet or exceed ON Semiconductor standards.
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