Datasheet 搜索 > 微控制器 > NXP（恩智浦） > MC9S12DP512CPVER 数据手册 > MC9S12DP512CPVER 产品描述及参数 1/4 页
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MC9S12DP512CPVER 产品描述及参数 - NXP（恩智浦）
制造商:
NXP（恩智浦）
分类:
微控制器
封装:
LQFP-112
描述:
其他系列 25MHz 512K@x8bit 12KB
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© Freescale Semiconductor, Inc., 2005. All rights reserved.
Freescale Semiconductor
Engineering Bulletin
This product incorporates SuperFlash
®
technology licensed from SST.
EB618/D
Rev. 4, 4/2005
Typical Data Retention for
Nonvolatile Memory
By Martin Niset and Peter Kuhn
NVM Reliability
Austin, Texas
Introduction
This document explains how Freescale Semiconductor defines typical data retention in the product
specification of nonvolatile memory (NVM).
Definition
Data retention refers to the ability of a memory bit to retain its data state over long periods of time
regardless of whether the part is powered on or powered off.
Freescale Semiconductor guarantees a minimum data retention life in its product specification (generally
10 to 20 years). In practice, our technologies are capable of producing much longer lifetimes than the
specified minimum. To give a better representation of the data retention life that can be achieved for most
parts under nominal conditions, Freescale Semiconductor also provides a typical value in the product
specification.
Freescale Semiconductor defines typical data retention by de-rating the intrinsic data retention capability
of a technology to a normalized use condition.
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