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MMPF0100F1EPR2 其他数据使用手册 - Freescale(飞思卡尔)
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VFQFN-56
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MMPF0100F1EPR2数据手册
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FSL
Log
o
PRODUCT BULLETIN
Generic Copy
ISSUE DATE: 13-Jun-2013
NOTIFICATION: 15708
TITLE:
MMPF0100 C&I Devices Test Expansion from ASE Korea to Freescale
Tianjin China Test Facility
EFFECTIVE
DATE:
14-Jun-2013
DEVICE(S)
MPN
MMPF0100F0EP
MMPF0100F0EPR2
MMPF0100F1EP
MMPF0100F1EPR2
MMPF0100F2EP
MMPF0100F2EPR2
MMPF0100NPEP
MMPF0100NPEPR2
AFFECTED CHANGE CATEGORIES
• TEST SITE
DESCRIPTION OF CHANGE
Freescale Semiconductor is announcing the test site expansion for the MMPF0100 C&I
devices listed in this notification, from the current ASE Korea Final Test Facility to the
Freescale Tianjin, China Final Test Facility.
REASON FOR CHANGE
Qualification of the Freescale Tianjin China Final Test Facility to improve manufacturing
flexibility and customer support.
ANTICIPATED IMPACT OF PRODUCT CHANGE(FORM, FIT, FUNCTION, OR
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