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Datasheet 搜索 > TVS二极管 > Fairchild(飞兆/仙童) > MMSD4148 数据手册 > MMSD4148 产品修订记录 3/3 页
MMSD4148
器件3D模型
0.101
导航目录
  • 封装尺寸在P1
MMSD4148数据手册
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Qualification Plan
Device
Package
Process
No. of Lots
Q20130033
MMSZ4697
SOD123
Zener
2
Test Description:
Standard:
Duration:
Results:
MSL1 Precondition
JESD22-A113
0/462
Temperature Humidity Bias
Test
JESD22-A101B
1000 hrs
0/154
High Temperature Reverse
Bias Test
JESD22-A108
1000 hrs
0/154
High Temperature Storage
Life
JESD22-A103
1000 hrs
0/154
Power Cycle
MIL-STD-750-
1036
10000
cycles
0/154
Temperature Cycle
JESD22-A104
500 cycles
0/154
Qualification Plan
Device
Package
Process
No. of Lots
Q20130033
MMSD4148
SOD123
Diode
3
Test Description:
Standard:
Duration:
Results:
MSL1 Precondition
JESD22-A113
0/693
Temperature Humidity Bias
Test
JESD22-A101B
1000 hrs
0/231
High Temperature Reverse
Bias Test
JESD22-A108
1000 hrs
0/231
High Temperature Storage
Life
JESD22-A103
1000 hrs
0/231
Power Cycle
MIL-STD-750-
1036
10000
cycles
0/231
Temperature Cycle
JESD22-A104
500 cycles
0/231
3 of 3

MMSD4148 数据手册

Fairchild(飞兆/仙童)
4 页 / 0.07 MByte
Fairchild(飞兆/仙童)
3 页 / 0.05 MByte
Fairchild(飞兆/仙童)
1 页 / 0.06 MByte
Fairchild(飞兆/仙童)
3 页 / 0.17 MByte
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