Datasheet 搜索 > TVS二极管 > ST Microelectronics（意法半导体） > SM6T6V8AY 数据手册 > SM6T6V8AY 产品修订记录 1/5 页
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SM6T6V8AY 产品修订记录 - ST Microelectronics（意法半导体）
制造商:
ST Microelectronics（意法半导体）
分类:
TVS二极管
封装:
DO-214AA-2
描述:
STMICROELECTRONICS SM6T6V8AY TVS二极管, AEC-Q342, Transil SM6T系列, 单向, 5.8 V, 13.4 V, DO-214AA, 2 引脚
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PRODUCT / PROCESS CHANGE INFORMATION
1. PCI basic data
1.1 Company STMicroelectronics International N.V
1.2 PCI No. CRP/18/10710
1.3 Title of PCI ALTERNATIVE METHODOLOGY FOR BIAS & LINEARITY STUDIES IN SEMICONDUCTOR
INDUSTRY
1.4 Product Category ALL automotive products
1.5 Issue date 2018-05-10
2. PCI Team
2.1 Contact supplier
2.1.1 Name MARSHALL DAVE
2.1.2 Phone
2.1.3 Email dave.marshall@st.com
2.2 Change responsibility
2.2.1 Process Owner Guy CAUQUIL
2.1.2 Corporate Quality Manager Roberto LISSONI
3. Change
3.1 Category 3.2 Type of change 3.3 Manufacturing Location
Parametric Test Modification of testing method or program with
no change of test coverage and no change of
spec limit
The improved methodology is ready to be
applied on all ST manufacturing Front End
plants.
4. Description of change
Old New
4.1 Description To conduct bias & linearity studies, AIAG MSA
manual rely on a statistical approach based on
t-test statistical value, which provides a criteria
to judge if the difference in bias or linearity
response is statistically different from zero
compared to the repeatability of the metrology
system.
Bias & Linearity studies based on Ttest
statistics approach conducted at several ST
Front-End manufacturing plants, involving
either identical or different metrology
techniques tested over their operating range,
all exhibit some bias error and nonlinear
behavior.
A clear picture on the consequences of this
established situation versus the accuracy
requirement has been highlighted by Sematech
consortium few years ago and is summarized
in the Sematech internal document in:
http://sematech.org/docubase/document/Semic
onductor_Industry_MSA_Practices.pdf
An alternative methodology to outdoing
classical statistical approach as described in
the AIAG MSA Manual - which appears to be no
more suitable to the semiconductor industries
- is provided by rather focusing the statistical
studies on:
- The compliance of the bias to the metrology
supplier accuracy
- The stability of the linearity response of the
system over time
- The consistency of the linearity response
within equipment fleet
The method which is described in the ST
Company Specification “MEASURING SYSTEM
ANALYSIS (M.S.A.)”, DMS #0151977 is based
on a statistical analysis to verify the good
correlation (R2) between the values given by
the metrology systems over their operation
range. The method also allow to verify that the
level of misalignment between metrology
systems does not impact the quality decision
judgment.
4.2 Anticipated Impact on form,fit,
function, quality, reliability or
processability?
form: no changes in the product
fit: no changes in the product
function: no changes in the product
reliability or processability: no changes in the product
5. Reason / motivation for change
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