Datasheet 搜索 > 微控制器 > ST Microelectronics(意法半导体) > STM32F217ZET7 数据手册 > STM32F217ZET7 产品修订记录 6/12 页


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STM32F217ZET7 产品修订记录 - ST Microelectronics(意法半导体)
制造商:
ST Microelectronics(意法半导体)
分类:
微控制器
封装:
LQFP-144
描述:
ARM微控制器 - MCU High-performance Arm Cortex-M3 MCU with 512 Kbytes Flash, 120 MHz CPU, ART Accelerator, Ethernet, HW crypto
Pictures:
3D模型
符号图
焊盘图
引脚图
产品图
页面导航:
技术参数、封装参数在P12
应用领域在P12
型号编号列表在P2
导航目录
STM32F217ZET7数据手册
Page:
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When ?
The production on the new dice revisions will start from:
Products
Wafer Fab site
Samples
availability date
Implementation
date
STM32F401xB &
STM32F401xC
Crolles 300 (France) Week 30 2014 Week 34 2014
STM32F401xD &
STM32F401xE
Crolles 300 (France) Week 32 2014 Week 36 2014
STM32F2x &
STM32F405x &
STM32F407x &
STM32F415x &
STM32F417x
ST SAS Rousset (France)
Week 37 2014
Week 41 2014
Crolles 300 (France) Week 37 2014 Week 41 2014
How will the change be qualified?
This change will be qualified using the standard STMicroelectronics Corporate
Procedures for Quality and Reliability, in full compliancy with the JESD-47
international standard.
You can find below the qualification plan document.
How can the change be seen?
Traceability of the change is ensured by ST internal tools.
The die revision letter will change as indicated in the below table:
Products
Wafer Fab site
Actual
New
STM32F2x
ST SAS Rousset (France)
“X”
“V”
Crolles 300 (France)
“1”
“2”
STM32F401x
Crolles 300 (France)
“A”
“Z”
STM32F405x &
STM32F407x &
STM32F415x &
STM32F417x
ST SAS Rousset (France)
“Z”
“Y”
Crolles 300 (France)
“1”
“2”
You can find the die revision letter marked on the package.
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