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TDA7850 产品修订记录 - ST Microelectronics（意法半导体）
制造商:
ST Microelectronics（意法半导体）
分类:
音频放大器
封装:
25-Flexiwatt
描述:
AB 类功率放大器ST 的汽车音频 AB 类功率放大器提供清晰和强劲的音频。 这些特性均得益于单通道设备和更加强大的四通道单芯片设计。坚固的设计，带集成的短路、ESD、卸荷、过热保护 可驱动非常低的阻抗扬声器 产品符合全新停止-启动引擎和混合引擎标准 可选 I²C 接口和诊断 可选数字输入 可选增加效率 ### 音频放大器，STMicroelectronics
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TDA7850数据手册
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PRODUCT / PROCESS CHANGE INFORMATION
1. PCI basic data
1.1 Company STMicroelectronics International N.V
1.2 PCI No. CRP/18/10710
1.3 Title of PCI ALTERNATIVE METHODOLOGY FOR BIAS & LINEARITY STUDIES IN SEMICONDUCTOR
INDUSTRY
1.4 Product Category ALL automotive products
1.5 Issue date 2018-05-10
2. PCI Team
2.1 Contact supplier
2.1.1 Name MARSHALL DAVE
2.1.2 Phone
2.1.3 Email dave.marshall@st.com
2.2 Change responsibility
2.2.1 Process Owner Guy CAUQUIL
2.1.2 Corporate Quality Manager Roberto LISSONI
3. Change
3.1 Category 3.2 Type of change 3.3 Manufacturing Location
Parametric Test Modification of testing method or program with
no change of test coverage and no change of
spec limit
The improved methodology is ready to be
applied on all ST manufacturing Front End
plants.
4. Description of change
Old New
4.1 Description To conduct bias & linearity studies, AIAG MSA
manual rely on a statistical approach based on
t-test statistical value, which provides a criteria
to judge if the difference in bias or linearity
response is statistically different from zero
compared to the repeatability of the metrology
system.
Bias & Linearity studies based on Ttest
statistics approach conducted at several ST
Front-End manufacturing plants, involving
either identical or different metrology
techniques tested over their operating range,
all exhibit some bias error and nonlinear
behavior.
A clear picture on the consequences of this
established situation versus the accuracy
requirement has been highlighted by Sematech
consortium few years ago and is summarized
in the Sematech internal document in:
http://sematech.org/docubase/document/Semic
onductor_Industry_MSA_Practices.pdf
An alternative methodology to outdoing
classical statistical approach as described in
the AIAG MSA Manual - which appears to be no
more suitable to the semiconductor industries
- is provided by rather focusing the statistical
studies on:
- The compliance of the bias to the metrology
supplier accuracy
- The stability of the linearity response of the
system over time
- The consistency of the linearity response
within equipment fleet
The method which is described in the ST
Company Specification “MEASURING SYSTEM
ANALYSIS (M.S.A.)”, DMS #0151977 is based
on a statistical analysis to verify the good
correlation (R2) between the values given by
the metrology systems over their operation
range. The method also allow to verify that the
level of misalignment between metrology
systems does not impact the quality decision
judgment.
4.2 Anticipated Impact on form,fit,
function, quality, reliability or
processability?
form: no changes in the product
fit: no changes in the product
function: no changes in the product
reliability or processability: no changes in the product
5. Reason / motivation for change
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