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TMS320F28020DAT 产品修订记录 - TI（德州仪器）
制造商:
TI（德州仪器）
分类:
微控制器
封装:
TSSOP-38
描述:
TEXAS INSTRUMENTS TMS320F28020DAT 微控制器, 32位, Piccolo, C2000, 40 MHz, 32 KB, 6 KB, 38 引脚, TSSOP
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TMS320F28020DAT数据手册
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若手册格式错乱，请下载阅览PDF原文件
Texas Instruments, Inc. PC N# 20130904000
Reference Qual: F05 Process Qualification at Aizu
Qualification Data: Approved 06/2012
This qualification has been developed for the validation of this change. The qualification data will
validate that the proposed change meets the applicable released technic al specifications.
Qual Vehicle 1: TMS320F2803XAPN
Wafer Fab Site:
AIZU
Metallization:
TiN/AlCu/TiN
Wafer Fab Process:
F05
Wafer diameter:
200mm
Qualification: Plan Test Results
Reliability Test
Conditions
Sample Size/Fail
Lot#1 Lot#2 Lot#3
20K W/E
20K Write / Erase Cycles prior to HTSL,
HTOL, RTSL
1800/0
-
-
High Temperature Op Life
125C - 1000 Hours
231/0
-
-
*High Temp Storage Life
150C Bake - 1000 Hours
231/0
-
-
Room Temp Storage Life
25C – 1000 Hours
231/0
-
-
Package Reliability
-
-
*Preconditioning
MSL3/260C
693/0
-
-
*THB
85C/85RH
231/0
-
-
*Temp Cycle
-65C/150C 500 Cycles
231/0
-
-
*Autoclave
121C/96hrs
231/0
-
-
ESD-HBM
2000v
15/0
-
-
ESD-CDM
750v
6/0
-
-
Latch up
1.5Vdd +/-100mA 125C
6/0
-
-
Notes:
* Test requires Moisture Preconditioning
Qualif ication tests “pass” on zero fails for each test
For questions regarding this notice, e-mails can be sent to the regional contacts shown below
or your local Field Sales Representative.
Location
E-Mail
USA
PCNAmericasContact@list.ti.com
Europe
PCNEuropeContact@list.ti.com
Asia Pacific
PCNAsiaContact@list.ti.com
Japan
PCNJapanContact@list.ti.com
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