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TMS320F28020DAT 其他数据使用手册 - TI（德州仪器）
制造商:
TI（德州仪器）
分类:
微控制器
封装:
TSSOP-38
描述:
TEXAS INSTRUMENTS TMS320F28020DAT 微控制器, 32位, Piccolo, C2000, 40 MHz, 32 KB, 6 KB, 38 引脚, TSSOP
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TMS320F28020DAT数据手册
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若手册格式错乱，请下载阅览PDF原文件
Texas Instruments, Inc. PC N# 20130904000
Reference Qual: F05 Process Qualification at Aizu
Qualification Data: Approved 06/2012
This qualification has been developed for the validation of this change. The qualif ication data will
validate that the proposed change meets the applicable released technic al specifications.
Qual Vehicle 1: TMS320F2803XAPN
Wafer Fab Site:
AIZU
Metallization:
TiN/AlCu/TiN
Wafer Fab Process:
F05
Wafer diameter:
200mm
Qualification: Plan Test Results
Reliability Test
Conditions
Sample Size/Fail
Lot#1 Lot#2 Lot#3
20K W/E
20K Write / Erase Cycles prior to HTSL,
HTOL, RTSL
1800/0
-
-
High Temperature Op Life
125C - 1000 Hours
231/0
-
-
*High Temp Storage Life
150C Bake - 1000 Hours
231/0
-
-
Room Temp Storage Life
25C – 1000 Hours
231/0
-
-
Package Reliability
-
-
*Preconditioning
MSL3/260C
693/0
-
-
*THB
85C/85RH
231/0
-
-
*Temp Cycle
-65C/150C 500 Cycles
231/0
-
-
*Autoclave
121C/96hrs
231/0
-
-
ESD-HBM
2000v
15/0
-
-
ESD-CDM
750v
6/0
-
-
Latch up
1.5Vdd +/-100mA 125C
6/0
-
-
Notes:
* Test requires Moisture Preconditioning
Qualification tests “pass” on zero fails for each test
For questions regarding this notice, e-mails can be sent to the regional contacts shown below
or your local Field Sales Representative.
Location
E-Mail
USA
PCNAmericasContact@list.ti.com
Europe
PCNEuropeContact@list.ti.com
Asia Pacific
PCNAsiaContact@list.ti.com
Japan
PCNJapanContact@list.ti.com
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