Datasheet 搜索 > FET驱动器 > TI（德州仪器） > TPIC46L01DB 数据手册 > TPIC46L01DB 其他数据使用手册 1/5 页
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TPIC46L01DB 其他数据使用手册 - TI（德州仪器）
制造商:
TI（德州仪器）
分类:
FET驱动器
封装:
SSOP-28
描述:
6通道串行和并行低侧前置FET驱动器 6-CHANNEL SERIAL AND PARALLEL LOW-SIDE PRE-FET DRIVER
Pictures:
3D模型
符号图
焊盘图
引脚图
产品图
页面导航:
功能描述在P1
导航目录
TPIC46L01DB数据手册
Page:
of 5 Go
若手册格式错乱，请下载阅览PDF原文件
Texas Instruments, Inc. PCN 20160630001
PCN Number:
20160630001
PCN Date:
Dec 13, 2016
Title:
DFAB VLCT Offload to SCT
Customer Contact:
PCN Manager
Dept:
Quality Services
Proposed 1
st
Ship Date:
June 13, 2017
Change Type:
Assembly Site
Design
Wafer Bump Site
Assembly Process
Data Sheet
Wafer Bump Material
Assembly Materials
Part number change
Wafer Bump Process
Mechanical Specification
Test Site
Wafer Fab Site
Packing/Shipping/Labeling
Test Process
Wafer Fab Materials
Wafer Fab Process
PCN Details
Description of Change:
Texas Instruments Incorporated is announcing the transfer of select high volume demand devices
using VLCT tester in DFAB (Dallas South bldg. North Campus) to VLCT tester EBT/SCT (Dallas SC
Building in North Campus).
Test programs are identical.
Test hardware configurations identical.
Reason for Change:
Consolidate the VLCT tester to one probe facility
Mitigate test capacity shortage in DFAB.
Material test cycle time improvement.
Anticipated impact on Form, Fit, Function, Quality or Reliability (positive / negative):
None
Changes to product identification resulting from this PCN:
Current
Site
site code (20L)
country code (21L)
DFAB
DFB
USA
New
Site
site code (20L)
country code (21L)
SCT
DM4
USA
Example shipping label (not actual product label)
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