Web Analytics
Datasheet 搜索 > 开发套件 > TI(德州仪器) > TPL5000EVM 数据手册 > TPL5000EVM 用户编程技术手册 5/21 页
TPL5000EVM
¥ 172.423
导航目录
TPL5000EVM数据手册
Page:
of 21 Go
若手册格式错乱,请下载阅览PDF原文件
TPL5000
www.ti.com
SNAS628B JULY 2013REVISED DECEMBER 2014
7.5 Electrical Characteristics
(1)
Specifications are for T
A
=T
J
= 25°C, VDD-GND=2.5 V, unless otherwise stated.
PARAMETER TEST CONDITIONS MIN
(2)
TYP
(3)
MAX
(2)
UNIT
POWER SUPPLY
IVDD Supply current
(4)
PGOOD = VDD 30 50 nA
PGOOD = GND 12 nA
TIMER
t
DP
Timer Delay Period 1, 2, 4, 8,
10, 16, 32, s
64
Timer Delay drift over life time
(5)
0.06%
Timer Delay drift over temperature 400 ppm/°C
t
CAL
Calibration pulse width 14.063 15.625 17.188 ms
t
DP
to t
CAL
matching error
(6)
VDD 3.0 V 0.1
t
DONE
DONE Pulse width
(6)
100 ns
t
RSTn
RSTn Pulse width 15.625 ms
t
WAKE
WAKE Pulse width 31.25 ms
DIGITAL LOGIC LEVELS
VIH Logic High Threshold PGOOD, DONE 0.7xVDD V
VIL Logic Low Threshold PGOOD, DONE 0.3xVDD V
WAKE, TCAL
VDD-0.3 V
Iout = 100 uA
VOH Logic output High Level
WAKE, TCAL
VDD-0.7 V
Iout = 1 mA
WAKE, TCAL
0.3 V
Iout = -100 uA
VOL Logic output Low Level
WAKE, TCAL
0.7 V
Iout = -1 mA
VOL
RSTn
RSTn Logic output Low Level IOL= -1 mA 0.3 V
IOH
RSTn
RSTn High Level output current VOH
RSTn
=VDD 1 nA
(1) Electrical Characteristics Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions
result in very limited self-heating of the device such that T
J
= T
A.
(2) Limits are specified by testing, design, or statistical analysis at 25°C. Limits over the operating temperature range are specified through
correlations using statistical quality control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped
production material.
(4) The supply current does not take in account load and pull-up resistor current. Input pins are at GND or VDD.
(5) Operational life time test procedure equivalent to10 years.
(6) Ensured by design.
Copyright © 2013–2014, Texas Instruments Incorporated Submit Documentation Feedback 5
Product Folder Links: TPL5000

TPL5000EVM 数据手册

TI(德州仪器)
50 页 / 2.2 MByte
TI(德州仪器)
18 页 / 0.31 MByte
TI(德州仪器)
21 页 / 0.78 MByte
TI(德州仪器)
32 页 / 1.49 MByte

TPL5000 数据手册

TI(德州仪器)
TPL5000 毫微功率可编程定时器和监控器
TI(德州仪器)
TEXAS INSTRUMENTS  TPL5000DGST  芯片, 定时器, 可编程, 5V, VSSOP-10
TI(德州仪器)
TPL5000纳米功耗可编程定时器,带有看门狗功能 TPL5000 Nano Power Programmable Timer with Watchdog Functionality
TI(德州仪器)
TEXAS INSTRUMENTS  TPL5000EVM  评估模块, TPL5000EVM
器件 Datasheet 文档搜索
器件加载中...
AiEMA 数据库涵盖高达 72,405,303 个元件的数据手册,每天更新 5,000 多个 PDF 文件