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TPL5000EVM 用户编程技术手册 - TI(德州仪器)
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TI(德州仪器)
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Module
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TEXAS INSTRUMENTS TPL5000EVM 评估模块, TPL5000EVM
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TPL5000EVM数据手册
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TPL5000
www.ti.com
SNAS628B –JULY 2013–REVISED DECEMBER 2014
7.5 Electrical Characteristics
(1)
Specifications are for T
A
=T
J
= 25°C, VDD-GND=2.5 V, unless otherwise stated.
PARAMETER TEST CONDITIONS MIN
(2)
TYP
(3)
MAX
(2)
UNIT
POWER SUPPLY
IVDD Supply current
(4)
PGOOD = VDD 30 50 nA
PGOOD = GND 12 nA
TIMER
t
DP
Timer Delay Period 1, 2, 4, 8,
10, 16, 32, s
64
Timer Delay drift over life time
(5)
0.06%
Timer Delay drift over temperature 400 ppm/°C
t
CAL
Calibration pulse width 14.063 15.625 17.188 ms
t
DP
to t
CAL
matching error
(6)
VDD ≤ 3.0 V 0.1
t
DONE
DONE Pulse width
(6)
100 ns
t
RSTn
RSTn Pulse width 15.625 ms
t
WAKE
WAKE Pulse width 31.25 ms
DIGITAL LOGIC LEVELS
VIH Logic High Threshold PGOOD, DONE 0.7xVDD V
VIL Logic Low Threshold PGOOD, DONE 0.3xVDD V
WAKE, TCAL
VDD-0.3 V
Iout = 100 uA
VOH Logic output High Level
WAKE, TCAL
VDD-0.7 V
Iout = 1 mA
WAKE, TCAL
0.3 V
Iout = -100 uA
VOL Logic output Low Level
WAKE, TCAL
0.7 V
Iout = -1 mA
VOL
RSTn
RSTn Logic output Low Level IOL= -1 mA 0.3 V
IOH
RSTn
RSTn High Level output current VOH
RSTn
=VDD 1 nA
(1) Electrical Characteristics Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions
result in very limited self-heating of the device such that T
J
= T
A.
(2) Limits are specified by testing, design, or statistical analysis at 25°C. Limits over the operating temperature range are specified through
correlations using statistical quality control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped
production material.
(4) The supply current does not take in account load and pull-up resistor current. Input pins are at GND or VDD.
(5) Operational life time test procedure equivalent to10 years.
(6) Ensured by design.
Copyright © 2013–2014, Texas Instruments Incorporated Submit Documentation Feedback 5
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