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DRV2603RUNT 其他数据使用手册 - TI（德州仪器）
制造商:
TI（德州仪器）
分类:
运算放大器
封装:
QFN-10
描述:
TEXAS INSTRUMENTS DRV2603RUNT 芯片, 触觉/震动驱动器, LRA/ERM, 10QFN
Pictures:
3D模型
符号图
焊盘图
引脚图
产品图
页面导航:
引脚图在P3Hot
典型应用电路图在P11P12
原理图在P1P7
封装尺寸在P16P18P19
标记信息在P16
封装信息在P15P16P17P18P19
技术参数、封装参数在P3
应用领域在P1P21
电气规格在P4
导航目录
DRV2603RUNT数据手册
Page:
of 21 Go
若手册格式错乱，请下载阅览PDF原文件
EN
PWM
NC OUT -
VDD
GND
OUT +
LRA / ERM
GND
GND
5
10
1
2
3
4
9
8
7
6
DRV2603
www.ti.com
SLOS754B –JUNE 2012–REVISED SEPTEMBER 2015
5 Pin Configuration and Functions
RUN Package
10-Pin WQFN
Top View
Pin Functions
PIN
I/O/P
(1)
DESCRIPTION
NAME NO.
EN 1 I Device enable
GND 5, 8, 10 P Supply ground
LRA/ERM 3 I Mode selection. ERM = Low, LRA = High
NC 4 I No Connection
OUT+ 9 O Positive haptic driver differential output
OUT– 6 O Negative haptic driver differential output
PWM 2 I Input signal
VDD 7 P Supply Input (2.5 V to 5.5 V)
(1) I = Input, O = Output, P = Power
6 Specifications
6.1 Absolute Maximum Ratings
(1)
over operating free-air temperature range, T
A
= 25°C (unless otherwise noted)
MIN MAX UNIT
Supply voltage VDD –0.3 6 V
V
I
Input voltage EN, PWM, LRA/ERM –0.3 V
DD
+ 0.3 V
T
A
Operating free-air temperature range –40 85 °C
T
J
Operating junction temperature range –40 150 °C
T
stg
Storage temperature range –65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
6.2 ESD Ratings
VALUE UNIT
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001
(1)
±2000
Electrostatic
V
(ESD)
V
discharge
Charged-device model (CDM), per JEDEC specification JESD22-C101
(2)
±500
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
Copyright © 2012–2015, Texas Instruments Incorporated Submit Documentation Feedback 3
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