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LMC6482IMX/NOPB 其他数据使用手册 - TI（德州仪器）
制造商:
TI（德州仪器）
分类:
运算放大器
封装:
SOIC-8
描述:
TEXAS INSTRUMENTS LMC6482IMX/NOPB 芯片, 运算放大器, 1.5MHz, 1.3V/uS, SOIC-8
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典型应用电路图在P20P21
封装尺寸在P28P30P31
标记信息在P28P29
封装信息在P28P29P30P31
技术参数、封装参数在P2
应用领域在P1P17P22P24P35
电气规格在P2P3P4P5P6P7P8P9P10P11P12P13
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LMC6482IMX/NOPB数据手册
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LMC6482
www.ti.com
SNOS674D –NOVEMBER 1997–REVISED MARCH 2013
AC Electrical Characteristics (continued)
Unless otherwise specified, all limits specified for T
J
= 25°C, V
+
= 5V, V
−
= 0V, V
CM
= V
O
= V
+
/2, and R
L
> 1M. Boldface limits
apply at the temperature extremes.
LMC6482AI LMC6482I LMC6482M
Typ
Parameter Test Conditions Limit Limit Limit Units
(1)
(2) (2) (2)
G
m
Gain Margin 15 dB
Amp-to-Amp Isolation
(4)
150 dB
e
n
Input-Referred Voltage Noise F = 1kHz 37
nV/√Hz
V
cm
= 1V
I
n
Input-Referred Current Noise F = 1kHz 0.03 pA/√Hz
T.H.D. Total Harmonic Distortion F = 10kHz, A
V
= −2 0.01
%
R
L
= 10kΩ, V
O
= 4.1 V
PP
F = 10kHz, A
V
= −2 0.01 %
R
L
= 10kΩ, V
O
= 8.5 V
PP
V
+
= 10V
(4) Input referred, V
+
= 15V and R
L
= 100 kΩ connected to 7.5V. Each amp excited in turn with 1 kHz to produce V
O
= 12 V
PP
.
DC Electrical Characteristics
Unless otherwise specified, all limits specified for T
J
= 25°C, V
+
= 3V, V
−
= 0V, V
CM
= V
O
= V
+
/2 and R
L
> 1M.
LMC6482AI LMC6482I LMC6482M
Typ
Parameter Test Conditions Limit Limit Limit Units
(1)
(2) (2) (2)
V
OS
Input Offset Voltage 0.9 2.0 3.0 3.0 mV
2.7 3.7 3.8 max
TCV
OS
Input Offset Voltage
2.0 μV/°C
Average Drift
I
B
Input Bias Current 0.02 pA
I
OS
Input Offset Current 0.01 pA
CMRR Common Mode Rejection 0V ≤ V
CM
≤ 3V 74 64 60 60 dB
Ratio min
PSRR Power Supply Rejection 3V ≤ V
+
≤ 15V, V
−
= 0V 80 68 60 60 dB
Ratio min
V
CM
Input Common-Mode For CMRR ≥ 50dB V
−
−0.25 0 0 0 V
Voltage Range max
V
+
+ 0.25 V
+
V
+
V
+
V
min
V
O
Output Swing R
L
= 2kΩ to V
+
/2 2.8 V
0.2 V
R
L
= 600Ω to V
+
/2 2.7 2.5 2.5 2.5 V
min
0.37 0.6 0.6 0.6 V
max
I
S
Supply Current Both Amplifiers 0.825 1.2 1.2 1.2 mA
1.5 1.5 1.6 max
(1) Typical Values represent the most likely parametric norm.
(2) All limits are specified by testing or statistical analysis.
Copyright © 1997–2013, Texas Instruments Incorporated Submit Documentation Feedback 5
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