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PIC32MX110F016D-I/PT 用户编程技术手册 - Microchip（微芯）
制造商:
Microchip（微芯）
分类:
微控制器
封装:
TQFP-44
描述:
MICROCHIP PIC32MX110F016D-I/PT 微控制器, 32位, 音频和图形接口, PIC32, 40 MHz, 16 KB, 4 KB, 44 引脚, TQFP
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PIC32MX110F016D-I/PT数据手册
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2007-2013 Microchip Technology Inc. DS61145L-page 5
PIC32
4.0 CONNECTING TO THE DEVICE
The PIC32 family provides two possible physical
interfaces for connecting to and programming the
memory contents (Figure 4-1). For all programming
interfaces, the target device must be properly powered
and all required signals must be connected. In addition,
the interface must be enabled, either through its
Configuration bit, as in the case of the JTAG 4-wire
interface, or though a special initialization sequence, as
is the case for the 2-wire ICSP interface.
The JTAG interface is enabled by default in blank
devices shipped from the factory.
Enabling ICSP is described in Section 7.0 “Entering
2-Wire Enhanced ICSP Mode”.
FIGURE 4-1: PROGRAMMING
INTERFACES
4.1 4-wire Interface
One possible interface is the 4-wire JTAG (IEEE
1149.1) port. Table 4-1 lists the required pin
connections. This interface uses the following four
communication lines to transfer data to and from the
PIC32 device being programmed:
• TCK – Test Clock Input
• TMS – Test Mode Select Input
• TDI – Test Data Input
• TDO – Test Data Output
These signals are described in the following four
sections. Refer to the specific device data sheet for the
connection of the signals to the device pins.
4.1.1 TEST CLOCK INPUT (TCK)
TCK is the clock that controls the updating of the TAP
controller and the shifting of data through the Instruc-
tion or selected Data register(s). TCK is independent of
the processor clock with respect to both frequency and
phase.
4.1.2 TEST MODE SELECT INPUT (TMS)
TMS is the control signal for the TAP controller. This
signal is sampled on the rising edge of TCK.
4.1.3 TEST DATA INPUT (TDI)
TDI is the test data input to the Instruction or selected
Data register(s). This signal is sampled on the rising
edge of TCK for some TAP controller states.
4.1.4 TEST DATA OUTPUT (TDO)
TDO is the test data output from the Instruction or Data
register(s). This signal changes on the falling edge of
TCK. TDO is only driven when data is shifted out,
otherwise the TDO is tri-stated.
TABLE 4-1: 4-WIRE INTERFACE PINS
Programmer
2-wire
ICSP™
OR
4-wire
JTAG
+ MCLR
, VDD, VSS
PIC32
Device Pin Name Pin Type Pin Description
MCLR I Programming Enable
ENVREG
(2)
I Enable for On-Chip Voltage Regulator
V
DD and AVDD
(1)
P Power Supply
V
SS and AVSS
(1)
P Ground
VCAP P CPU logic filter capacitor connection
TDI I Test Data In
TDO O Test Data Out
TCK I Test Clock
TMS I Test Mode State
Legend: I = Input O = Output P = Power
Note 1: All power supply and ground pins must be connected, including analog supplies (AV
DD) and ground
(AV
SS).
2: The ENVREG pin is not available on all devices. Please refer to the “Pin Diagrams” section in the
specific device data sheet to determine availability.
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