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CL21C220FBANNWC 产品描述及参数 - Samsung(三星)
制造商:
Samsung(三星)
分类:
电容
封装:
0805
Pictures:
3D模型
符号图
焊盘图
引脚图
产品图
页面导航:
封装信息在P1
导航目录
CL21C220FBANNWC数据手册
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of 2 Go
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Vibration Test
Capacitance change : within ±2.5% Amplitude : 1.5mm
Tan δ, IR : initial spec.
From 10㎐ to 55㎐ (return : 1min.)
2hours 3 direction (x, y, z)
Moisture
Capacitance change : within ±7.5% With rated voltage
Resistance
Q : 173.33 min
40±2℃, 90~95%RH, 500 +12/-0 hours
IR :
More than 25㏁·㎌
High Temperature
Capacitance change : within ±3% Wit
h
of the rated voltage
Resistance
Q : 330 min Max. operating temperature
IR :
More than 50㏁·㎌
1000+48/-0 hours
Temperature
Capacitance change : within ±2.5% 1 cycle condition
Cycling
Tan δ, IR : initial spec. Min. operating temperature
→
25℃
→
Max. operating temperature
→
25℃
5 cycles test
C. Recommended Soldering method :
Reflow ( Reflow Peak Temperature : 260+0/-5℃, 10sec. Max )
* For the more detail Specification, Please refer to the Samsung MLCC catalogue.
200%
Performance Test condition
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