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ATTINY167-A15MD 其他数据使用手册 - Microchip（微芯）
制造商:
Microchip（微芯）
分类:
微控制器
封装:
QFN
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ATTINY167-A15MD数据手册
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5
7792B–AVR–05/09
ATtiny87/ATtiny167 Automotive
2. Grade 0 Qualification
The ATtiny87/ATtiny167 has been developed and manufactured according to the most strin-
gent quality assurance requirements of ISO-TS-16949 and verified during product qualification
as per AEC-Q100 grade 0.
AEC-Q100 qualification relies on temperature accelerated stress testing. High temperature
field usage however may result in less significant stress test acceleration. In order to prevent
the risk that ATtiny87/ATtiny167 lifetime would not satisfy the application end-of-life reliability
requirements, Atmel
®
has extended the testing, whenever applicable (High Temperature
Operating Life Test, High Temperature Storage Life, Data Retention, Thermal Cycles), far
beyond the AEC-Q100 requirements. Thereby, Atmel verified the ATtiny87/ATtiny167 has a
long safe lifetime period after the grade 0 qualification acceptance limits.
The valid domain calculation depends on the activation energy of the potential failure mecha-
nism that is considered. Therefore any temperature mission profile which could exceed the
AEC-Q100 equivalence domain shall be submitted to Atmel for a thorough reliability analysis
Figure 2-1. AEC-Q100 Lifetime Equivalence
AEC-Q100 Lifetime Equivalence
1
10
100
1000
10000
100000
1000000
0 20406080100120140160
Temperature (°C)
Hours
HTOL 0,59eV HTSL 0,45eV
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