Datasheet 搜索 > 电容排 > AVX（艾维克斯） > W2A4ZC104MAT2A 数据手册 > W2A4ZC104MAT2A 其他数据使用手册 4/6 页
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W2A4ZC104MAT2A 其他数据使用手册 - AVX（艾维克斯）
制造商:
AVX（艾维克斯）
分类:
电容排
封装:
0508
描述:
AVX W2A4ZC104MAT2A 电容阵列, 0.1 µF, ± 20%, 4元件, 10 V, 0508 [1220公制], SMD
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W2A4ZC104MAT2A数据手册
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Page <4> V1.030/05/14
Multilayer SMD Ceramic Capacitor Arrays
4 x 0402, 4 x 0603 Size, NP0, X7R & Y5V Dielectrics, 10V to 100V (MCY4C Series)
No Item Test Condition Requirements
12
Temperature
Cycle
Conduct the ve cycles according to
the temperatures and time.
Step
Temp. (°C)
Time
(min.)
1
Min. operating temp. +0/-3
30±3
2
Room temp.
2~3
3
Max. operating temp. +3/-0
30±3
4
Room temp.
2~3
Before initial measurement (Class II
only): Perform 150+0/-10°C for 1 hr and
then set for 24±2 hrs at room temp.
Measurement to be made after keeping
at room temp. for 24±2 hrs.
No remarkable damage.
Cap change:
NP0: within ±2.5% or ±0.25pF whichever is larger.
X7R: within ±7.5%
Y5V: within ±20%
Q/D.F., I.R. and dielectric strength: To meet initial require-
ments.
13
Humidity
(Damp Heat)
Steady State
Test temp.: 40±2°C
Humidity: 90~95% RH
Test time: 500+24/-0hrs.
Before initial measurement (Class II
only): Perform 150+0/-10°C for 1 hr and
then set for 24±2 hrs at room temp
Measurement to be made after keeping
at room temp. for 24±2 hrs.
No remarkable damage.
Cap change: NP0: within ±5.0% or ±0.5pF whichever is
larger.
X7R: within ±12.5%
Y5V: within ±30%
Q/D.F. value:
NP0: Cap≥30pF, Q≥350; 10pF≤Cap<30pF, Q≥275+2.5C
Cap<10pF; Q≥200+10C
X7R: ≤3.0%
Y5V: ≤7.5%
I.R.: ≥1GΩ or RxC≥50Ω-F whichever is smaller.
14
Humidity
(Damp Heat)
Load
Test temp.: 40±2°C
Humidity: 90~95%RH
Test time: 500+24/-0 hrs.
To apply voltage : rated voltage
Before initial measurement (Class II
only): To apply test voltage for 1hr at
40°C and then set for 24±2 hrs at room
temp.
Measurement to be made after keeping
at room temp. for 24±2 hrs.
No remarkable damage.
Cap change: NP0: within ±7.5% or ±0.75pF whichever is
larger.
X7R: within ±12.5%
Y5V: within ±30%
Q/D.F. value:
NP0: Cap≥30pF, Q≥200; Cap<30pF, Q≥100+10/3C
X7R: ≤3.0%
Y5V: ≤7.5%
I.R.: ≥500MΩ or RxC≥25Ω-F whichever is smaller.
15
High
Temperature
Load
(Endurance)
Test temp.:
NP0, X7R: 125±3°C
Y5V: 85±3°C
To apply voltage: 200% of rated volt-
age.
Test time: 1000+24/-0 hrs.
Before initial measurement (Class II
only): To apply test voltage for 1hr at
test temp. and then set for 24±2 hrs at
room temp.
Measurement to be made after keeping
at room temp. for 24±2 hrs
No remarkable damage.
Cap change: NP0: within ±3.0% or ±0.3pF whichever is
larger.
X7R: within ±12.5%
Y5V: within ±30%
Q/D.F. value:
NP0: Cap≥30pF, Q≥350
10pF≤Cap<30pF, Q≥275+2.5C
Cap<10pF, Q≥200+10C
X7R: ≤3.0%
Y5V: ≤7.5%
I.R.: ≥1GΩ or RxC≥50Ω-F whichever is smaller.
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