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CDCLVD110 用户编程技术手册 - TI（德州仪器）
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TI（德州仪器）
描述:
具有最低时钟失真斜率最高 900MHz 的 1 至 10 LVDS 时钟缓冲器
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CDCLVD110数据手册
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FEATURES
LQFP PACKAGE
DESCRIPTION
CDCLVD110
SCAS684C – SEPTEMBER 2002 – REVISED JANUARY 2008
www.ti.com
Not Recommended for New Designs
PROGRAMMABLE LOW-VOLTAGE 1:10 LVDS CLOCK DRIVER
• Low-Output Skew <30 ps (Typical) for
Clock-Distribution Applications
• Distributes One Differential Clock Input to
10 LVDS Differential Clock Outputs
• V
CC
range 2.5 V ± 5%
• Typical Signaling Rate Capability of Up to
1.1 GHz
• Configurable Register (SI/CK) Individually
Enables Disables Outputs, Selectable CLK0,
CLK0 or CLK1, CLK1 Inputs
• Full Rail-to-Rail Common-Mode Input Range
• Receiver Input Threshold ± 100 mV
• Available in 32-Pin LQFP Package
• Fail-Safe I/O-Pins for V
DD
= 0 V (Power Down)
The CDCLVD110 clock driver distributes one pair of differential LVDS clock inputs (either CLK0 or CLK1) to 10
pairs of differential clock outputs (Q0, Q9) with minimum skew for clock distribution. The CDCLVD110 is
specifically designed for driving 50- Ω transmission lines.
When the control enable is high (EN = 1), the 10 differential outputs are programmable in that each output can
be individually enabled/disabled (3-stated) according to the first 10 bits loaded into the shift register. Once the
shift register is loaded, the last bit selects either CLK0 or CLK1 as the clock input. However, when EN = 0, the
outputs are not programmable and all outputs are enabled.
The CDCLVD110 is characterized for operation from – 40 ° C to 85 ° C.
Not Recommended for New Designs. Use CDCLVD110A as a Replacement.
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2002 – 2008, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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